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JETTA
- Special Issue on Low Power Test |
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Power dissipation has become the major design objective in many application areas, ranging from wireless communications to high performance computing. The low power devices face unique challenges during manufacturing test. In addition, because test throughput and manufacturing yield are affected by test power, new power-conscious test methodologies have emerged over the past decade. A special issue of JETTA on low power test is planned for publication in October 2007. The topics of interest include, but are not limited to:
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| Prospective authors should follow the author guidelines of JETTA available at http://www.springer.com/journal/10836/. In the submission process, under article type, make sure to indicate that this is Special Issue paper on Low Power Test. Important Dates |
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